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Database Administrator Resume

Hopewell Junction, NY


  • Highly - skilled and adaptable Senior Lab Specialist who works well under pressure, consistently meeting deadlines and targets while delivering high-quality results. Broad-base experience in failure analysis, quality control, and assurance fields,
  • With over 20 years in software design, development, and integration. Dependable and hardworking team member / leader with a desire to learn and be flexible in complex work environments.


Operating Systems: Windows (7, XP, 2000, 98); Ubuntu and RedHat Linux

Databases: Lotus Notes/Domino, SQL, MS-Access, Microsoft Excel

Languages: Visual Basic, C++ and Lotus Script

Web Technologies: Servlets, JSP, XML, XML Schema, JavaScript, CSS and HTML

Application Server: Apache Tomcat 4.x, IBM Lotus Domino

IDE: Eclipse and Domino Designer

Tools: MS Office 2003,2007, Lotus 1-2-3

Other: Data collection, analyses, & management


Confidential, Hopewell Junction, NY

Database Administrator


  • Provided end-users with workflow database application, facilitating the creation of analysis requests across several departments within characterization area and contracted partners.
  • Implemented secure way of storing / retrieving information regarding processes used in the production of semiconductor parts for gaming and communications sector, tracking confidential / non-confidential information through individual failure analysis labs.
  • Tracked purchases, transfers between facilities, and donations of tools purchased by failure analysis labs, eliminating duplicate purchases and helping control inventory problems between labs.
  • Improved operational performance by designing and implementing lean database to track reduction of waste: Lean is sustained by continuously improving processes used to produce deliverables customers require, resulting in identifying waste variability, removal, and additional improvements from stable baselines.
  • Tracked delivery of wafers to centralized lab and notified respective analyst on delivery / pick-up through the design and implementation of wafer depository database, which resulted in 1 focal point for overall tracking within failure analysis labs.
  • Performed analyses by cross-sectional destructive analysis using the scanning electron microscope (SEM), focused ion beam tool (FIB), or polishing, identifying root cause of failure or changes in defect cases.
  • Completed sample prep and collected photos of defects, utilizing SEMs to qualify tools for particular methods.

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